Christopher M Daft, PhD Expert Witness
Curriculum Vitae

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Specialties & Experience of this Expert Witness

General Specialties:

Intellectual Property and Medical Devices

Specialty Focus:

Imaging, Patent, Ultrasound, Electronics, Transducer, ASIC, MEMS, FDA, Signal Processing, Neuro modulation, Regulatory, Integrated Circuit, Semiconductors, Biometric security, Ablation, Tomography, Parallel Computing, Surgical Guidance, Wearable Medical Device, Product Liability

Education:

BA, Oxford University, UK; MA, Oxford University, UK; DPhil (= PhD), Oxford University, UK

Years in Practice:

30

Number of Times Deposed/Testified in Last 4 Yrs:

12

Additional Information

Award winning, Oxford Educated scientist whose areas of expertise include medical imaging, electronics, semiconductors, medical devices, sensors, MEMS, signal processing and image processing. Dr Daft has deposition and trial testimony experience including district court, ITC and PTAB matters. Extensive Intellectual Property experience including patent development, analysis, licensing, and litigation. Serial inventor who holds 26 U.S. Patents. Diverse industry experience including multi-nationals such as GE, Medtronic, Fujifilm, Samsung and Siemens as well as several start-ups. Well published. Winner of grants from National Institute of Health. Extensive international consulting experience. IEEE (Institute of Electrical and Electronic Engineers) Senior Member since 2004. Three years’ experience teaching electrical and computer engineering at the University of Illinois. Holds BA and MA in Physics from Oxford University as well as Doctorate from Oxford in Materials Science.